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000 defects per cm2
which covers the principles of eddy-current measurements as they relate to silicon wafers and certain thin films fabricated on such substrates
1-0226 — Specification for SECS-II Protocol for Processing Management
免責事項：このSEMIスタンダードは，投票により作成された英語版が正式なものであり，日本語版は日本の利用者各位の便宜のために作成したものです。万が一英語と日本語とに差異がある場合には英語版記載内容が優先されます｡
there are often several words used by the semiconductor industry to describe the same concept or device
PV08000 - SEMI PV80 - Specification of Indoor Lighting Simulator Requirements for Emerging Photovoltaic and Perovskite Solar Cell (PSC) Revision:SEMI PV80-0218 - Superseded 000 defects per cm2The International Commission on Illumination (CIE) has defined some lighting spectra for different indoor colorful applications and situations. However, the requirements for color testing do not apply to related indoor energy harvesting under different lighting uniformity and stability, for performance measurement of emerging photovoltaic (PV) and device. Furthermore, countless types of indoor lighting patterns are required to do performance